Hitachi HTS725050A9A364 Datasheet download pdf (Page 112)

7K500 OEM Specification

Page 112 of 176

State shall contain a value indicating the state of the device when the command was issued to the

device or the reset occurred as described below.

Value State

x0h

Unknown

x1h

Sleep

x2h

Standby

x3h

Active/Idle

x4h

SMART Off-line or Self-test

x5h-xAh

Reserved

xBh-xFh

Vendor specific

Note:

The value of x is vendor specific

14.17.2.4

14.17.2.414.17.2.4

14.17.2.4 Device

DeviceDevice

Device error count

error count error count

error count

This field shall contain the total number of errors attributable to the device that have been reported

by the device during the life of the device. This count shall not include errors attributed to the

receipt of faulty commands such as commands codes not implemented by the device or requests with

invalid parameters or invalid addresses. If the maximum value for this field is reached the count

shall remain at the maximum value when additional errors are encountered and logged.

14.17.3

14.17.314.17.3

14.17.3

Extended Self

Extended SelfExtended Self

Extended Self-

-tes

testes

test log sector

t log sectort log sector

t log sector

The following table defines the format of each of the sectors that comprise the Extended SMART

self-test log.

The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit

entries contained in the SMART self-test log, defined in “Self-test log data structure” shall also be

included in the Extended SMART self-test log with all 48-bit entries.

Description Bytes Offset

Self-test log data structure revision number 1 00h

Reserved 1 01h

Self-test descriptor index (7:0) 1 02h

Self-test descriptor index (15:8) 1 03h

Descriptor entry 1 26 04h

Descriptor entry 2 26 1Eh

...

Descriptor entry 19 26 1D8h

Vendor specific 2 1F2h

Reserved 11 1F4h

Data structure checksum 1 1FFh

512

Table 79 Extended Self-test log data structure

These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a

descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a

descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled

with zeros

14.17.3.1

14.17.3.114.17.3.1

14.17.3.1 Self

SelfSelf

Self-

-test log data structure revision number

test log data structure revision numbertest log data structure revision number

test log data structure revision number

The value of this revision number shall be 01h.

1 2 ... 107 108 109 110 111 112 113 114 115 116 117 ... 175 176

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Hitachi HTS725050A9A364 Datasheet Page 112

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